Features & Benefits
- Down to 100 ps Rise Time
- 4 GHz, 2.5 GHz, 1.5 GHz, 1 GHz and 500 MHz Bandwidth Models
- Up to 20 GS/s Real-time Sample Rate
- Up to 32 Megasamples Memory Depth
- >400,000 Wfms/second Maximum Waveform Capture Rate
- Exceptional Delta-time Accuracy for High-confidence in Critical Timing Measurements
- Communications Mask Testing Up to 2.5 Gbps Rates
- Clock Recovery from Serial Data Streams
- 32-Bit Serial Trigger for Isolation of Pattern-dependent Effects
- 10 MHz Time base Reference Input for Enhanced Accuracy and Repeatability
- MultiView Zoom for Quick Navigation of Long Records
- Control via Classic Direct Controls, Touch-sensitive Color Display or Mouse Navigation
- Open Microsoft Windows Environment
Applications
- Signal Integrity, Jitter and Timing Analysis
- Verification, Debug and Characterization of Sophisticated Designs
- Design Development and Compliance Testing of Serial Data Streams Up to 2.5 Gbps Rates for ecom and Datacom Industry Standards
- Debugging ecom, Datacom and Storage Area Network Equipment Designs and High Speed Backplanes
- Spectral Analysis
- Disk Drive Analysis
- Investigation of Transient Phenomena
Unmatched Performance, Simplicity and Connectivity
TDS7000 Series digital phosphor oscilloscopes provide the industry’s best solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs. The family features exceptional signal acquisition and analysis, operational simplicity and complete connectivity to your design environment and third party analysis software. The intuitive user interface, developed after months of customer research, was pioneered in the TDS7000 Series and is quickly becoming an industry standard.
Superior Performance Solves Signal Integrity Problems and Speeds Verification and Debug
Signal Fidelity
TDS7000 models, with bandwidths from 500 MHz to 4 GHz and single-shot sample rates to 20 GS/s, easily meet the demands of the latest high-speed logic families and multi-Gigabit communication standards. Acquisition memory up to 32 Megasamples maximizes the value of the high sample rate and ensures that critical events are captured with fine detail. Exceptional deltatime measurement performance provides dependably accurate measurements of the time interval between two events. And, the combination of exceptional trigger and acquisition performance, deep memory and application-specific software make the TDS7000 Series a high-performance jitter and timing analysis tool.
Superior probing performance is critical the fidelity of your measurement system. The P7260 6 GHz active probe faithfully acquires real-time signal information from high-speed designs with high-impedance, high-frequency circuit elements that demand minimal loading. The P7350 5 GHz differential probe provides high CMRR, broad frequency range, and minimal time skew between inputs.
The TDS7154, TDS7254 and TDS7404 models include the TekConnectTM signal interconnect system, which further ensures superior signal fidelity, while offering unparalleled versatility with the world’s widest array of accessory signal acquisition solutions for high-performance, real-time oscilloscopes. This convenient, positive locking interface replaces the traditional BNC connectors and is compatible with the P7000 Series probes. The TCA-1 MEG high-impedance buffer amplifier allows you to make high-voltage and micro-volt differential, current and other general purpose voltage measurements using existing Tektronix probing solutions that require a 1 MΩ termination. In addition, this amplifier provides input coupling (AC/DC/GND) and bandwidth limit (100 MHz, 20 MHz).
Waveform Capture Rate
The successful discovery of intermittent faults and characterization of complex, dynamic signals depend on the amount of time the signal is observed by the oscilloscope. With the TDS7000 Series you can fully visualize signal activity, because third-generation digital phosphor technology (DPXTM ) provides waveform capture rates of more than 400,000 waveforms per second. DPX has saved countless designers minutes, hours, or even days, by quickly revealing the nature of faults so you can apply the TDS7000’s sophisticated triggering to isolate them.
Application-specific Extensions
Optional application-specific measurement and analysis packages extend TDS7000 capabilities. These packages build on the precision acquisition performance of the TDS7000 Series to address the need for application-specific measurements to quickly quantify device and system performance.
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